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Wear Estimation for Devices with NAND Flash Memory
One of the most common persistent memory technology in today's embedded systems is NAND flash memory. Raw NAND flash, as well as eMMC chips, have a limited number of write/erase cycles. To get a long lifetime several strategies are used such as garbage collection, wear-levelling and error correction code algorithms. Potentially going through low-level firmware on the eMMC controller and across several layers of system software, it is rather difficult for an application programmer to understand what particular wear his program may impose on the underlying NAND flash. We are discussing an implementation to monitor the flash usage on the block level which can be used to make more accurate lifetime estimations and provide feedback to an application program for storage-related optimisations.
--- Datum: 25.02.2020 Uhrzeit: 9:30 - 10:00 Uhr Ort: Conference Counter NCC Ost