Conferences and supporting programme
Overcoming the challenges of rapid change in Automotive leveraging an Open HIL platform
Rapid functionality growth in modern vehicles directly leads to exploding test complexity when validating embedded software. To fulfill cost and timeline restrictions it is necessary to rely on as much reuse as possible for both test cases and test systems. An Open HIL platform is key to multi-vendor heterogeneous systems which will allow a best-in-class approach for test automation.
--- Date: 27.02.2019 Time: 2:30 PM - 3:00 PM Location: Exhibitor's Forum, Hall 3, 3-719