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26 - 28 February 2019 // Nuremberg, Germany

Conferences and supporting programme

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Presentations Exhibitor´s Forum

Overcoming the challenges of rapid change in Automotive leveraging an Open HIL platform Vortragssprache Englisch

Rapid functionality growth in modern vehicles directly leads to exploding test complexity when validating embedded software. To fulfill cost and timeline restrictions it is necessary to rely on as much reuse as possible for both test cases and test systems. An Open HIL platform is key to multi-vendor heterogeneous systems which will allow a best-in-class approach for test automation.

--- Date: 27.02.2019 Time: 2:30 PM - 3:00 PM Location: Exhibitor's Forum, Hall 3, 3-719

Speakers

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Daniel Clapham

National Instruments Germany GmbH

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