Conferences and supporting programme
Optical In-line Metrology Systems for Displays
Summary Quality requirements for displays in mobile devices are getting more tight. Therefore sophisticated strategies quality control are necessary. Optical inspection systems (AOI) are contributing on a large scale in display production, by control of the €¢ Bare glass €¢ Edge grinding and hole drilling €¢ Coatings €¢ Printed areas (frames, company logos, ...)
--- Date: 26.02.2020 Time: 16:35 - 16:55 Location: Conference Counter NCC Ost
Speakers
Hans Oerley
/ Dr. Schenk Industriemesstechnik