This website uses cookies to make the offer more user-friendly and effective. Please agree to the use of cookies in order to be able to use all functions of the website.Further information

26 - 28 February 2019 // Nuremberg, Germany

Conferences and supporting programme

back to day overview
Session 01 I - Functional Safety I

Designing Embedded Systems for Autonomous Driving with Functional Safety and Reliability Vortragssprache Englisch

The automotive industry is facing significant demands to address societal challenges such as energy transition, traffic congestion and safe and secure mobility. So, electrification, connectivity and autonomy are pivotal areas to focus efforts on. Embedded systems need a solid foundation of quality, safety defined and designed solutions and extended robustness to allow for this transition. This lecture will discuss a methodology applied to power management devices for applications that require the highest level of functional safety. This methodology accompanies the user from the development phase through to system design, explaining safety hardware, linking to reliability and showing how fit for ASIL D architecture can help improve functional robustness of an embedded system. This session will also discuss how quality processes developed to satisfy the high-performance requirements of embedded systems enable an extended robustness that is instrumental for reducing and preventing systematic failures. Furthermore, the power management architecture will be introduced to demonstrate how it brings intelligence, diagnostics and redundancy to safety related systems. Failure conditions need to be identified and dedicated hardware management strategies can then be implemented to achieve tolerance to fault conditions. Extended qualification tests have been performed to assess reliability robustness and to show how a device can operate under different environments. Different Grades are defined to represent this qualification and the environmental conditions that they correspond to. This lecture will also show the results of some Grade 0 tests performed on power management solutions to secure the temperature operating range that results from the extended life time and increased power performance needed for car electrification.

--- Date: 27.02.2018 Time: 11:30 AM - 12:00 PM Location: Conference Counter NCC Ost

Speakers

man

David Lopez

/ NXP Semiconductors Germany GmbH

top

The selected entry has been placed in your favourites!

If you register you can save your favourites permanently and access all entries even when underway – via laptop or tablet.

You can register an account here to save your settings in the Exhibitors and Products Database and as well as in the Supporting Programme.The registration is not for the TicketShop and ExhibitorShop.

Register now

Your advantages at a glance:

  • Advantage Save your favourites permanently. Use the instant access – mobile too, anytime and anywhere – incl. memo function.
  • Advantage The optional newsletter gives you regular up-to-date information about new exhibitors and products – matched to your interests.
  • Advantage Call up your favourites mobile too! Simply log in and access them at anytime.