14 - 16 March 2017 // Nuremberg, Germany

Posting print layout

What information should be shown in the print layout?

Create print layout
Zoom product LOGO_SMARC-Module testen

SMARC-Module testen

LOGO_SMARC-Module testen

SMARC-Module testen

Request information Request information

Contact us

Please enter your personal information and desired appointment. You can also leave us a message.

Your personal information

Your message for us

Desired appointment during the exhibition

* Compulsory fields you must fill in.
Send
Your message has been sent.

Would you like to use more facilities and advantages of the platform? Then please log in – or register here.

An error has occurred.

Munich, January 2016 – Yamaichi Electronics has developed a new test adapter for the SMARC computer-on-module standard. It realises the perfect alignment of the contacts and allows for 100% contacting reliablity. Due to the use of spring probe pins very high contact cycles can be reached.

SMARC stands for Smart Mobility ARChitecture. It is a specification published by the Standardization Group for Embedded Technologies e.V. (SGET) for computer-on-modules (CoMs). Its advantage is the low power consumption of the modules due to the implemetation of ARM or other low-power processors.

Yamaichi Electronics´ SMARC test adapter is a performance controlled system according to the SGET SMARC specification. It is durable and highly reliable as a contact system. As it is volume test ready it can increase the test output considerably. Thus it reduces the cost per tested module. Furthermore its operation is easy and secure.

This test adapter within the YED900 series of Yamaichi Electronics´ test adapter series can be used for applications like

  • evaluation bench tests and
  • reliability tests from -50°C up to +150°C

The socket is designed with compression mount technology (CMT), therefore no soldering is needed. Selected materials like aircraft aluminum, PEEK and ceramic PEEK make the adapter robust. The test adapter can be used as “plug and play” suitable test vehicle.

Reliable Probe Pin Technology
SMARC modules have gold pads as contacting surface. The best contact technology for such surface areas are fine pitch probe pins. The pins, known from semiconductor testing, have a very long life time. The life time for the SMARC test adapter is specified up to 50k mechanical cycles.

For contacting the module pads, a conical type plunger tip is commonly used. By using such a tip it can be assured that only a very small witness mark is formed on the module contact pad. The fine-pitch pins are available for pitches starting from 0.3mm. There are also Kelvin type pins available.

Yamaichi Electronics_M2M Wireless Module Test Contactor

LOGO_Yamaichi Electronics_M2M Wireless Module Test Contactor

There are no entries in your notes.

Show notes



top

The selected entry has been placed in your notes!

If you register you can save your notes permanently and access all entries even when underway – via laptop or tablet.

You can register an account here to save your settings in the Exhibitors and Products Database and as well as in the Supporting Programme.The registration is not for the TicketShop and ExhibitorShop.

Register now

Your advantages at a glance:

  • Advantage Save your notes permanently. Use the instant access to exhibitors or products saved – mobile too, anytime and anywhere – incl. memo function.
  • Advantage The optional newsletter gives you regular up-to-date information about new exhibitors and products – matched to your interests.
  • Advantage Call up your notes mobile too! Simply log in and access them at anytime.