Konferenzen und Rahmenprogramm
Self-testing in Embedded Systems
All electronic systems carry the possibility of failure. An embedded system has intrinsic intelligence that facilitates the possibility of predicting failure and mitigating its effects. This paper reviews the options for self-testing that are open to the embedded software developer. Testing algorithms for memory are outlined and some ideas for self-monitoring software in multi-tasking and multi-CPU systems are discussed.
--- Datum: 01.03.2018 Uhrzeit: 14:30 Uhr - 15:00 Uhr Ort: Conference Counter NCC Ost