Konferenzen und Rahmenprogramm
Impact of the 3rd Edition of IEC 61508-1/-2 on Your Development
Currently IEC 61508 is going through its second maintenance process (IEC SC 65A MT 61508-1/-2). As IEC 61508 is a Basic Safety Publication, changes in this standard will have an impact on application specific standards and the development of new products. This presentation gives a short overview of the planned modifications and highlights the most important parts for the user and their possible impact on current and future developments. The third edition of IEC 61508 will update the requirements for the development and selection of complex semiconductors, will improve the topic of common cause failures and specify how to treat the failing of diagnostics. The requirements on tool classification and qualification will be extended. What does that mean for your current development? You might need to do a better tool classification and qualification, common cause failures need to be analyzed more systematically and you might need to reconsider your selection of semiconductors. How much credit can you take from semiconductors with integrated diagnostics? The answers to these and other questions will be given.
--- Datum: 25.02.2020 Uhrzeit: 11:30 - 12:00 Uhr Ort: Conference Counter NCC Ost