Konferenzen und Rahmenprogramm
Effective Power Interruption Testing - How Best to Fail
From dropped batteries to system failures, embedded designs need solid power interruption testing. Reliability demands for embedded products have increased as the desired lifetime of high reliability products has grown. To achieve the most comprehensive reliability test in the least time, stress testing must utilize I/O at the point of power interruption. This session will survey the failure points of file systems and flash media, with a discussion of the most effective strategies for ensuring that test design accounts for the variety of real world failures that can occur. Validation of data and hardware requirements will also be discussed.
--- Datum: 01.03.2018 Uhrzeit: 11:30 Uhr - 12:00 Uhr Ort: Conference Counter NCC Ost